The National Research Council Canada (NRC) has a requirement for the supply of an Automated Cassette-to-Cassette Photoluminescence (PL) and White-Light Reflectance Wafer (WLR) Mapping System designed to deliver exceptional two-dimensional homogeneity in materials characterization processes.
The NRC’s characterization process utilizes the G10 MOCVD Reactor, a high-performance system capable of producing semiconductor wafers at a specific throughput and production speed. Given the G10’s ability to generate wafers rapidly and in large volumes, any subsequent analytical or characterization tool must be capable of matching this output rate to prevent bottlenecks in the production or research workflow.
Accordingly, the analytical tool must provide the necessary speed, automation, and measurement capacity to align with the reactor’s output volume, ensuring seamless integration and maintaining the efficiency of the overall process
