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CEI Mississauga Research Center is looking to acquire a Benchtop X-ray Diffractometer (XRD) to conduct analysis of material samples for Materials and Chemical Science applications. As such, the XRD must be capable of initially analyzing powder samples, small crystal samples, thin film samples, and metallic samples. Any equipment purchased must be able to be configured in future for work in the condition as requirements evolve. The Benchtop XRD must be easy to use and must have the requirements for re-alignment after reconfiguration of optical components reduced to a minimum – as such a ‘plug and play’ type system that can be implemented in automated workflows is required. The system requirements are listed below.
All deliverables must be received no later than below:
20 weeks from the date of contract award.
Lowest Price
NRC seeks a Benchtop X-ray Diffractometer for material analysis.
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